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Nanoscaled Reference Materials
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Category: Lateral (X-Y-axis, 2-dim)

 

Description Certified value (nm) RM name RM type RM no.
Lateral-(xy)-calibration standard
2-dim lattice of inverted square pyramids, 200 nm pitch, etched into a silicon chip
100 2D100, 2D200 RM  34
Nanoscale AFM-CD standard
line width; 50, 100, 150, ...
50, 100, 150 Nanoscale AFM-CD standard RM 35
NanoCD standards (NCD)
25, 45, 70, 110
25, 45, 70, 110 NanoCD standards (NCD) RM 36
NanoLattice pitch standard (NLSM) 100, 200 NanoLattice pitch standard (NLSM) RM 37
Standard micro scale
It consists of two direction rulers
100 HJ-2000,2100 CRM 75


  

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2015-09-10  

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Dr. rer. nat.
Georg Reiners
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12203 Berlin
phone:
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email:
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